Diagnostic device, diagnostic method and program

专利名称：Diagnostic device, diagnostic method and

program

发明人：梅沢 知紀申请号：JP2018044791申请日：20180312公开号：JP2019159728A公开日：20190919

专利附图：

摘要：A diagnostic device, a diagnostic method, and a program that can easily detectan abnormality for each processing step. A detection unit that compares a plurality ofdifferent processing information according to the type of processing process of a target

device to determine the same type of processing process and detects a physical quantitythat changes according to an operation during the processing process of the targetdevice The presence or absence of abnormality in the target device is determined byusing the grouping unit that groups multiple detection information output from eachgroup for each processing process of the same type, and the detection informationgrouped by the grouping unit and the detection information for the determinationtarget. And an abnormality determination unit that performs. [Selection] Figure 1

申请人：株式会社リコー

地址：東京都大田区中馬込１丁目３番６号

国籍：JP

代理人：酒井 宏明

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